-----Original Message-----
From: Shreyansh Jain
Sent: Wednesday, January 18, 2017 10:42 AM
To: 'Thomas Monjalon' <redacted>
Cc: dev@dpdk.org
Subject: RE: [PATCH v8 2/9] test: add basic bus infrastructure tests

quoted

-----Original Message-----
From: Thomas Monjalon [mailto:thomas.monjalon@6wind.com]
Sent: Wednesday, January 18, 2017 4:54 AM
To: Shreyansh Jain <redacted>
Cc: dev@dpdk.org
Subject: Re: [PATCH v8 2/9] test: add basic bus infrastructure tests

2017-01-17 19:07, Shreyansh Jain:

quoted

+REGISTER_TEST_COMMAND(bus_autotest, test_bus);

You should add it to app/test/autotest_data.py

Ok. I will do that.

quoted

quoted

+/* Bus list exposed */
+extern struct rte_bus_list rte_bus_list;

I think it should be possible to write a test without the real list
of registered bus.

Yes, it is possible. I just modeled it on test_pci assuming that is a kind of
expected/standard. But, it seems probably it is not. I will change the tests.

After sending out this mail I realized the real reason for using the actual lists. Functions like rte_eal_pci_register (for PCI) or rte_bus_register (for Bus), use global lists for registration. Test cases calls these functions for registering dummy device/bus.

One way is to not worry about adding these test/dummy devices/buses to original list as they would be unregistered anyway. But, risk is of impacting running list assuming multiple cases need to be run from same application/binary context.

Another way is to rewrite these functions locally in test case, but that also means not testing these global registration/de-registration functions.

Former method would continue to have symbols exported. Later is not testing some entry/exit functions of a sub-system.

You still interested in this change?