On Thu, 3 Aug 2017 12:01:54 -0500
Rob Herring [off-list ref] wrote:

On Mon, Jul 24, 2017 at 06:10:39PM +0200, Fabrice Gasnier wrote:

quoted

STM32 ADC allows each channel to be sampled with a different sampling
time. There's an application note that deals with this: 'How to get
the best ADC accuracy in STM32...' It basically depends on analog input
signal electrical properties (depends on board).

Add optional 'st,min-sample-time-nsecs' property so this can be tuned
in dt.

Signed-off-by: Fabrice Gasnier <redacted>
---
Changes in v2:
- Use 'st,min-sample-time-nsecs' instead of 'min-sample-time'.
---
 Documentation/devicetree/bindings/iio/adc/st,stm32-adc.txt | 5 +++++
 1 file changed, 5 insertions(+)  

Acked-by: Rob Herring <redacted>

Applied to the togreg branch of iio.git and pushed out as testings.

Thanks for review Rob and thanks for the patch Fabrice.

Jonathan

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