BIST (Built-In Self Test) is an IP responsible for triggering hardware
circuitry tests on both logic as well as memory blocks. This driver is
currently being upstreamed in U-Boot [1] (on hold till the dt-binding
is approved here) and triggers these tests on cores. This patch series
adds the dt-binding as well as a node for BIST on J784S4 and J742S2.

Changes since v3:
https://lore.kernel.org/all/20250514072056.639346-1-n-francis@ti.com/ (local)
- Udit
	- add support for J742S2

Changes since v2:
https://lore.kernel.org/all/20250328111439.374748-1-n-francis@ti.com/ (local)
- Krzysztof
	- use existing common definition (ti,sci-dev-id) for grabbing
	  the device ID instead of redefining properties

Changes since v1:
https://lore.kernel.org/all/20241128140825.263216-1-n-francis@ti.com/ (local)
- Krzysztof
	- move from misc/ to soc/ti/
	- minor property changes
	- drop ti,bist-instance and instead opt for ti,bist-under-test
	- correct example dt

[1] https://lore.kernel.org/all/20250204123147.939917-1-n-francis@ti.com/ (local)

Neha Malcom Francis (2):
  dt-bindings: soc: ti: bist: Add BIST for K3 devices
  arm64: dts: ti: k3-j784s4-j742s2-main-common: Add PBIST_14 node

 .../bindings/soc/ti/ti,j784s4-bist.yaml       | 63 +++++++++++++++++++
 .../dts/ti/k3-j784s4-j742s2-main-common.dtsi  | 11 ++++
 2 files changed, 74 insertions(+)
 create mode 100644 Documentation/devicetree/bindings/soc/ti/ti,j784s4-bist.yaml

-- 
2.34.1