@@ -0,0 +1,67 @@
+# SPDX-License-Identifier: (GPL-2.0-only OR BSD-2-Clause)
+# Copyright (C) 2025 Texas Instruments Incorporated
+%YAML 1.2
+---
+$id: http://devicetree.org/schemas/soc/ti/ti,j784s4-bist.yaml#
+$schema: http://devicetree.org/meta-schemas/core.yaml#
+
+title: Texas Instruments K3 BIST
+
+maintainers:
+  - Neha Malcom Francis <n-francis@ti.com>
+
+description:
+  The BIST (Built-In Self Test) module is an IP block present in K3 devices
+  that support triggering of BIST tests, both PBIST (Memory BIST) and LBIST
+  (Logic BIST) on a core. Both tests are destructive in nature. At boot, BIST
+  is executed by hardware for the MCU domain automatically as part of HW POST.
+
+properties:
+  compatible:
+    const: ti,j784s4-bist
+
+  reg:
+    maxItems: 2
+
+  reg-names:
+    items:
+      - const: cfg
+      - const: ctrl_mmr
+
+  clocks:
+    maxItems: 1
+
+  power-domains:
+    maxItems: 1
+
+  ti,bist-under-test:
+    $ref: /schemas/types.yaml#/definitions/uint32-array
+    description:
+      the device IDs of the devices under test control of the BIST device, the
+      number of devices may be more than one. The HW logic will trigger the
+      tests on all of these devices at once.
+
+required:
+  - compatible
+  - reg
+  - reg-names
+  - ti,bist-under-test
+
+additionalProperties: false
+
+examples:
+  - |
+    #include <dt-bindings/soc/ti,sci_pm_domain.h>
+    bus {
+        #address-cells = <2>;
+        #size-cells = <2>;
+        safety-selftest@33c0000 {
+            compatible = "ti,j784s4-bist";
+            reg = <0x00 0x033c0000 0x00 0x400>,
+                  <0x00 0x0010c1a0 0x00 0x01c>;
+            reg-names = "cfg", "ctrl_mmr";
+            clocks = <&k3_clks 237 7>;
+            power-domains = <&k3_pds 237 TI_SCI_PD_EXCLUSIVE>;
+            ti,bist-under-test = <343>, <344>, <365>, <366>;
+        };
+    };