[...]

quoted

quoted

@@ -170,19 +202,36 @@ static int mv_ehci_probe(struct platform_device *pdev)
      }

      platform_set_drvdata(pdev, ehci_mv);
-     ehci_mv->pdata = pdata;
      ehci_mv->hcd = hcd;

-     ehci_mv->clknum = pdata->clknum;
-     for (clk_i = 0; clk_i < ehci_mv->clknum; clk_i++) {
-             ehci_mv->clk[clk_i] =
-                 devm_clk_get(&pdev->dev, pdata->clkname[clk_i]);
-             if (IS_ERR(ehci_mv->clk[clk_i])) {
-                     dev_err(&pdev->dev, "error get clck \"%s\"\n",
-                             pdata->clkname[clk_i]);
-                     retval = PTR_ERR(ehci_mv->clk[clk_i]);
-                     goto err_clear_drvdata;
+     retval = mv_ehci_parse_dt(pdev, ehci_mv);
+     if (retval > 0) {

Is this why you returned 1 from mv_ehci_parse_dt? So you only do this if you
don't have a dt node?

If so, why not rip the check (and positive error code) out of mv_ehci_parse_dt,
and then here:

if (pdev->dev.of_node) {
        retval = mv_ehci_parse_dt(pdev, ehci_mv);
} else
        fall back to mv_usb_platform_data ...
}

That makes it obvious that one side depends on dt and the other's a fallback,
and doesn't rely on nonstandard return code behaviour.

I will change it.

quoted

Also, why not return immediately if mv_ehci_parse_dt fails?

I do not understand. if mv_ehci_parse_dt returns negative value, the
probe will be finished immediately.

Yes, you're right. I got myself confused about the logic.

Thanks,
Mark.