-----Original Message-----
From: Pavan Nikhilesh Bhagavatula <redacted>
Sent: Wednesday, September 22, 2021 1:58 AM
To: Naga Harish K, S V <redacted>; Jerin Jacob
Kollanukkaran [off-list ref]; Jayatheerthan, Jay
[off-list ref]
Cc: dev@dpdk.org
Subject: RE: [EXT] [dpdk-dev] [PATCH v2 2/5] test/event: add unit test for
event buffer size config api

quoted

this patch adds unit test for
rte_event_eth_rx_adapter_create_with_params
api and validate all possible input combinations.

Signed-off-by: Naga Harish K S V <redacted>
---
app/test/test_event_eth_rx_adapter.c | 53
+++++++++++++++++++++++++---
1 file changed, 49 insertions(+), 4 deletions(-)

diff --git a/app/test/test_event_eth_rx_adapter.c

b/app/test/test_event_eth_rx_adapter.c
index add4d8a678..3c0f0ad7cc 100644

--- a/app/test/test_event_eth_rx_adapter.c
+++ b/app/test/test_event_eth_rx_adapter.c

@@ -428,6 +428,50 @@ adapter_create_free(void)

	return TEST_SUCCESS;
}

+static int
+adapter_create_free_v2(void)
+{
+	int err;
+
+	struct rte_event_port_conf rx_p_conf = {
+			.dequeue_depth = 8,
+			.enqueue_depth = 8,
+			.new_event_threshold = 1200,
+	};
+
+	struct rte_event_eth_rx_adapter_params rxa_params = {
+			.event_buf_size = 1024
+	};
+
+	err =
rte_event_eth_rx_adapter_create_with_params(TEST_INST_ID,
+				TEST_DEV_ID, NULL, NULL);
+	TEST_ASSERT(err == -EINVAL, "Expected -EINVAL got %d", err);
+
+	err =
rte_event_eth_rx_adapter_create_with_params(TEST_INST_ID,
+				TEST_DEV_ID, &rx_p_conf,
&rxa_params);
+	TEST_ASSERT(err == 0, "Expected 0 got %d", err);
+
+	err =
rte_event_eth_rx_adapter_create_with_params(TEST_INST_ID,
+				TEST_DEV_ID, &rx_p_conf,
&rxa_params);
+	TEST_ASSERT(err == -EEXIST, "Expected -EEXIST %d got %d", -
EEXIST, err);
+
+	rxa_params.event_buf_size = 0;
+	err =
rte_event_eth_rx_adapter_create_with_params(TEST_INST_ID,
+				TEST_DEV_ID, &rx_p_conf,
&rxa_params);
+	TEST_ASSERT(err == -EINVAL, "Expected -EINVAL got %d", err);
+
+	err = rte_event_eth_rx_adapter_free(TEST_INST_ID);
+	TEST_ASSERT(err == 0, "Expected 0 got %d", err);
+
+	err = rte_event_eth_rx_adapter_free(TEST_INST_ID);
+	TEST_ASSERT(err == -EINVAL, "Expected -EINVAL %d got %d", -
EINVAL, err);
+
+	err = rte_event_eth_rx_adapter_free(1);
+	TEST_ASSERT(err == -EINVAL, "Expected -EINVAL %d got %d", -
EINVAL, err);
+
+	return TEST_SUCCESS;
+}
+
static int
adapter_queue_add_del(void)
{

@@ -435,7 +479,7 @@ adapter_queue_add_del(void)

	struct rte_event ev;
	uint32_t cap;

-	struct rte_event_eth_rx_adapter_queue_conf queue_config;
+	struct rte_event_eth_rx_adapter_queue_conf queue_config =
{0};

	err = rte_event_eth_rx_adapter_caps_get(TEST_DEV_ID,
TEST_ETHDEV_ID,
					 &cap);

@@ -523,7 +567,7 @@ adapter_multi_eth_add_del(void)

	uint16_t port_index, port_index_base, drv_id = 0;
	char driver_name[50];

-	struct rte_event_eth_rx_adapter_queue_conf queue_config;
+	struct rte_event_eth_rx_adapter_queue_conf queue_config =
{0};

	ev.queue_id = 0;
	ev.sched_type = RTE_SCHED_TYPE_ATOMIC; @@ -594,7 +638,7 @@
adapter_intr_queue_add_del(void)
	struct rte_event ev;
	uint32_t cap;
	uint16_t eth_port;
-	struct rte_event_eth_rx_adapter_queue_conf queue_config;
+	struct rte_event_eth_rx_adapter_queue_conf queue_config =
{0};

	if (!default_params.rx_intr_port_inited)
		return 0;

@@ -687,7 +731,7 @@ adapter_start_stop(void)

	ev.sched_type = RTE_SCHED_TYPE_ATOMIC;
	ev.priority = 0;

-	struct rte_event_eth_rx_adapter_queue_conf queue_config;
+	struct rte_event_eth_rx_adapter_queue_conf queue_config =
{0};

	queue_config.rx_queue_flags = 0;
	if (default_params.caps &

@@ -753,6 +797,7 @@ static struct unit_test_suite event_eth_rx_tests =

{
	.teardown = testsuite_teardown,
	.unit_test_cases = {
		TEST_CASE_ST(NULL, NULL, adapter_create_free),
+		TEST_CASE_ST(NULL, NULL, adapter_create_free_v2),

Please use a meaningful function name. In case of failure I don't thing "v2"
will gave any meaning

The test case name is changed with proper name in v3 of patch set.

quoted

		TEST_CASE_ST(adapter_create, adapter_free,
					adapter_queue_add_del),
		TEST_CASE_ST(adapter_create, adapter_free,
--
2.25.1