Re: [PATCH v2] test: Fix memory corruption issues which fails the link_bonding test.

It's caused by some recent merges.  Applying this patch to 17.05 is okay.  I've identified the place of segfault, but there're still some other problems to this test case.

Thanks,
Herbert

-----Original Message-----
From: Ferruh Yigit [mailto:ferruh.yigit@intel.com]
Sent: Wednesday, July 19, 2017 0:14
To: Herbert Guan <redacted>; dev@dpdk.org; declan.doherty@intel.com; jianbo.liu@linaro.org
Subject: Re: [dpdk-dev] [PATCH v2] test: Fix memory corruption issues which fails the link_bonding test.

On 7/10/2017 12:13 PM, Herbert Guan wrote:

Patch V2: fix build warnings by deleting unused variables.

There were double-free problems in some test cases, which will cause a
duplicated mbuf will be added into mempool.  After double-free, some
new allocated mbuf will hold a same address and thus cause the memory
corruption.

Another minor issue is that in some test cases, allocated mbuf will
not be released after test case exits.  Hopefully these leaked mbuf
will be released by the next test case in its setup phase when
stopping the virtual pmd ports, while this do is a memory leak of the
exited test case.

To fix above 2 issues, this patch will do:
1) Release virtual pmd ports' tx queue in the clean up function
   remove_slaves_and_stop_bonded_device() of each test cases.
2) Do not release allocated mbufs for test bursts.  These mbufs
   will be released in remove_slaves_and_stop_bonded_device() when
   test case exits.

Signed-off-by: Herbert Guan <redacted>

Updated unit test causing segfault, before and after patch, am I doing something wrong?

I will postpone this patch until unit test can be verified.

Thanks,
ferruh

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